2019 – IEEE PVSC 46
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Evaluation of Sodium Migration in SiNx With Capacitance-
Voltage Measurements
Guillaume von Gastrow, Erick Martinez-Loran, Jonathan Scharf, Jacob Clenney, Rico Meier, Mariana I. Bertoni, and David P. Fenning
Download PDF
Evaluation of Sodium Migration in SiNx With Capacitance-
Voltage Measurements
Guillaume von Gastrow, Erick Martinez-Loran, Jonathan Scharf, Jacob Clenney, Rico Meier, Mariana I. Bertoni, and David P. Fenning
Download PDF